Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: International Conference on Electromagnetic Fields and Applications - ICEF 2021
Guest editors: Yongjian Li
Article type: Research Article
Authors: Zhang, Taoa; b | Liu, Xuechaoa | Zhang, Weiruia | Liu, Ruiganga; | Xu, Canhuaa;
Affiliations: [a] Department of Biomedical Engineering, The Fourth Military Medical University, Xi’an, China | [b] Drug and Instrument Supervision and Inspection Station, Xining Joint Logistics Support Center, Lanzhou, China
Correspondence: [*] Corresponding authors: Canhua Xu, Department of Biomedical Engineering, The Fourth Military Medical University, Xi'an, 710032, China. E-mail: canhuaxu@fmmu.edu.cn and Ruigang Liu, Department of Biomedical Engineering, The Fourth Military Medical University, Xi'an, 710032, China. E-mail: ruigang@fmmu.edu.cn
Abstract: Magnetic induction tomography (MIT) has been proposed as a novel, non-invasive, and non-contact technique for diagnosing brain injuries. The design of the hardware system of MIT is a challenging research area. In this study, we constructed a 16-coil MIT simulation model with an actual cranio-cerebral anatomical structure in COMSOL. We analysed the factors which influence the MIT signal by constructing different types of haemorrhagic stroke models. In addition, the safety of MIT devices was evaluated in detail using the specific absorption rate. The results show that the phase noise of the hardware data acquisition system should be less than 0.001° for the detection of a small peripheral haemorrhage with 5 mL. The result of the specific absorption rate shows that the security of MIT equipment should not be overlooked, and we need to establish a trade-off between signal intensity and device security. This study can provide data to support additional improvements in the performance of hardware systems in the future.
Keywords: Head model, magnetic induction tomography, numerical simulation, three-dimensional modelling
DOI: 10.3233/JAE-210231
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 70, no. 4, pp. 377-386, 2022
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl