Evaluation of fatigue damage induced by pulsating tension stress and plane bending stress using the remnant magnetization method

Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)

Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto

Article type: Research Article

Authors: Oka, Mohachiro^{a; *} | Sato, Yuki^a | Yakushiji, Terutoshi^a | Enokizono, Masato^b

Affiliations: [a] National Institute of Technology, Oita College, Oita, Japan | [b] Vector Magnetic Characteristic Technical Laboratory, Joi Usa-city, Oita, Japan

Correspondence: [*] Corresponding author: Mohachiro Oka, National Institute of Technology, Oita College, 1666 Maki, Oita 870-0152, Japan. E-mail:oka@oita-ct.ac.jp

Abstract: It is well-known that the fatigue process is different depending on various kinds of applied stresses. To prevent accidents caused by material degradation such as fatigue, it is important to know the difference between causes of the fatigue process, such as pulsating tension stress as opposed to plane bending stress. The relationship between fatigue damage and remnant magnetization has been extensively researched using a thin-film flux-gate (FG) magnetic sensor for semi-stable austenitic stainless steel (SUS304 or ANSI304). Therefore, in this paper, the difference between the fatigue processes by pulsating tension fatigue and plane bending fatigue was investigated using the remnant magnetization method with a specimen made of SUS304. The remnant magnetization method with the FG magnetic sensor was non-destructively able to clarify the difference between the fatigue processes of SUS304 and the applied stress.

Keywords: Remnant magnetization, SUS304, fatigue, pulsating tension stress, plane bending stress

DOI: 10.3233/JAE-162098

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 1169-1176, 2016