Flat/film infinity coils and backside defect searching

Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)

Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto

Article type: Research Article

Authors: Hamanaka, Shunichi^{a; *} | Saito, Yoshifuru^a | Marinova, Iliana^b | Ohuch, Manabu^c | Kojima, Takaharu^c

Affiliations: [a] Graduate School of Electrical and Electronics Engineering, Hosei University, Tokyo, Japan | [b] Technical University of Sofia, Sofia, Bulgaria | [c] EMIC (Denshijiki Industry) Co, Ltd, Tokyo, Japan

Correspondence: [*] Corresponding author: Shunichi Hamanaka, Graduate School of Electrical Engineering, Hosei University, 3-7-2 Kajinocho, Koganei, Tokyo 184-8584, Japan. E-mail:shunichi.hamanaka.jc@stu.hosei.ac.jp

Abstract: Previously, we have proposed an infinity coil as a high sensibility ECT sensor. This paper has evaluated a possibility of the backside defect searching by the low frequency excitation of a modified infinity coil whose exciting coils are the flat/film shape to fit to the curverved test targets. In the present paper, we have elucidated the lift-off characteristics of the backside defect searching when employing the low frequency excitation to our flat/film shape infinity coil.

Keywords: Nondestructive testing, ECT, ∞ coil, backside defect searching

DOI: 10.3233/JAE-162073

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 1-2, pp. 289-295, 2016