Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Formisano, Alessandroa; | Martone, Raffaelea
Affiliations: [a] Department of Engineering, Università della Campania 'Luigi Vanvitelli', Aversa (CE), Italy
Correspondence: [*] Corresponding author: A. Formisano, Department of Engineering, Università della Campania 'Luigi Vanvitelli', I-81031 Aversa (CE), Italy. E-mail: Alessandro.Formisano@unicampania.it
Abstract: The resolution of inverse problems is a quite common task in the diagnostic processes based on electromagnetic field measurements, in particular when internal characteristics of the object under test must be estimated from external measurements. This class of problems are well known to be ill posed, and a number of different regularization techniques have been proposed to make the estimation process reliable. In this paper, with reference to an application in the framework of low frequency magnetic fields measurements, a comparison of some regularization techniques is presented, in order to highlight advantages and drawbacks of each in the proposed application.
Keywords: Inverse problems, magnetic measurements, regularization, tolerance assessment
DOI: 10.3233/JAE-191105
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 60, no. S1, pp. S49-S62, 2019
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl