Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Subtitle:
Article type: Research Article
Authors: Xu, Guanghui | Chen, Xing* | Zheng, Zhi | Huang, Kama
Affiliations: School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China
Correspondence: [*] Corresponding author: Xing Chen, School of Electronics and Information Engineering, Sichuan University, Chengdu 610064, Sichuan, China. Tel.: +86 134 5856 4058; E-mail:xingc@live.cn
Abstract: A hybrid full-wave electromagnetic (EM) field-circuit simulation method, which aims at accurately analyzing microwave circuits, is proposed. This method adopts the finite-difference time-domain (FDTD) algorithm for the EM simulation, the sophisticated equivalent models in a general circuit simulator SPICE for the circuit simulation, and hybridizes the FDTD and SPICE by using the equivalent current source (ECS) approach. Moreover, three techniques, which map a lumped circuit into FDTD cells as a wire, surface or volume structure respectively, are thoroughly studied. The formulae of the ECS with these three techniques are derived and introduced in detail, and their influences on the simulation accuracy are analyzed. The proposed method is applied to two sample circuits, a microstrip line and a frequency selective surface (FSS), both of which are loaded with diode pairs. The simulation results are compared with the measurement ones, and good agreement is observed, indicating the accuracy and versatility of the method.
Keywords: Finite-difference time-domain, SPICE, hybrid field-circuit simulation, equivalent current source
DOI: 10.3233/JAE-150008
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 49, no. 1, pp. 79-90, 2015
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl