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Article type: Research Article
Authors: Zhao, Yanga; d | Deng, Yimingb; * | Yan, Weia | Qiu, Xiaohuic | Liu, Yonga
Affiliations: [a] College of Electrical and Automation Engineering, Nanjing Normal University, Nanjing, Jiangsu, China | [b] Department of Electrical Engineering, University of Colorado Denver, Denver, CO, USA | [c] College of Telecommunication and Information Engineering, Nanjing University of Post and Telecommunication, Nanjing, Jiangsu, China | [d] State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, Jiangsu, China
Correspondence: [*] Corresponding author: Yiming Deng, LEAP, Department of Electrical Engineering, University of Colorado Denver, Denver, CO, USA. E-mail:yiming.deng@ucdenver.edu
Abstract: In the paper, we experimentally characterized the four methods and assessed both current method and voltage method based on its test schematics. The accuracy of the current method was analyzed based on current probe performance and circuit parasitic parameter performance (such as parasitic inductance), while the accuracy of voltage method was studied based on coupling capacitance performance and insertion component performance. The resonance effect was further investigated for differential mode noise source impedance extraction. We finally proposed a novel design and our theoretical analysis; simulation and experiment results showed that the conductive EMI noise can be reduced effectively by our innovative approach.
Keywords: Applied electromagnetic, conductive electromagnetic interference (EMI), noise source impedance extraction, electromagnetic compatibility (EMC)
DOI: 10.3233/JAE-140178
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 49, no. 3, pp. 347-361, 2015
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