Affiliations: [a] Department of Industrial Engineering, University of
Padova, Padova, Italy | [b] Institute of Inorganic Chemistry and Surfaces,
National Research Council, Padova, Italy | Université Laval, Canada | Tohoku University, Japan
Correspondence:
[*]
Corresponding author: Daniele Desideri, Department of Industrial
Engineering, University of Padova, via Gradenigo 6/a, I-35131, Padova, Italy.
Tel.: +39 04 982 775 66; Fax: +39 04 982 775 99; E-mail:
daniele.desideri@dii.unipd.it
Abstract: An improved version of a coaxial sample holder with continuous inner
conductor for measuring the shielding effectiveness of planar films is
presented. Keeping the design idea of the previously realized version of inner
conductor split in two parts that are screwed on the sample under test, new
aspects are: presence of tapered transitions, compact realization, and overall
small size (total length less than 150 mm; maximum diameter of the cylindrical
device of 48 mm). The theoretical only TEM mode maximum frequency is about 5
GHz. The assembly of the device is easy, as it is the sample preparation.
Experimental data have been get in the range 0.1 MHz–3 GHz by using a
vector network analyzer. The reliability of the system has been proved by
using, as reference samples, copper and aluminium thin films deposited by DC
magnetron sputtering on kapton substrates. Films with different thicknesses
have been prepared, with values around a few hundreds of nanometers, as
measured by using a surface profiler. The shielding effectiveness experimental
data of the used reference samples are reported and are well in agreement with
the theoretical values.
