Study of image reconstruction by UT probe array using truncated singular value decomposition

Issue title: Proceedings from the 16th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2013)

Guest editors: Xavier Maldague and Toshiyuki Takagi

Article type: Research Article

Authors: Nishimura, Yoshihiro^{a; *} | Suzuki, Takayuki^a | Fukuda, Katsumi^b | Fukuta, Masatoshi^b

Affiliations: [a] Advanced Manufacturing Research Institute, Tsukuba, Ibaraki, Japan | [b] Tokyo National College of Technology, Kunugida, Hachioji, Japan | Université Laval, Canada | Tohoku University, Japan

Correspondence: [*] Corresponding author: Yoshihiro Nishimura, Advanced Manufacturing Research Institute, AIST, AIST Tsukuba EAST 1-2-1 Tsukuba Ibaraki, 305-8564, Japan. Tel.: +81 29 861 9315, +81 29 861 7253; Fax: +81 29 861 7853; E-mail: nishimura.yoshihiro@aist.go.jp

Abstract: Ultrasonic Systems are useful for inspecting ceramic materials because ultrasonic waves are easily propagated in such materials. Conventional ultrasonic testing (UT) methods cannot easily identify internal defects. This study built a visualization system for detecting and reconstructing internal defect images using probe array UT. Internal defect images were reconstructed by applying truncated singular value decomposition. We investigated how the sampling frequency and truncation index affect the reconstructed defect images.

Keywords: UT probe array, defects, ultrasound, inverse problem, truncated singular value problem

DOI: 10.3233/JAE-141808

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 45, no. 1-4, pp. 21-26, 2014