Reliability-based design optimization using local sensitivity with application to magnetic nano switch

Issue title: Selected papers from the 12th International Workshop on Optimization and Inverse Problems in Electromagnetism (OIPE 2012)

Guest editors: Luc Dupré and Guillaume Crevecoeur

Article type: Research Article

Authors: Pham-Quang, Phuong^{a; *} | Delinchant, Benoit^a | Coulomb, Jean-Louis^a

Affiliations: [a] Grenoble Electrical Engineering Laboratory, St Martin d'Hères, France

Correspondence: [*] Corresponding author: Phuong Pham-Quang, Grenoble Electrical Engineering Laboratory, G2ELab, 11 rue des Mathématiques BP 46 38402, St Martin d'Hères Cedex, France. E-mail: phuong.phamquang@cedrat.com

Abstract: This paper presents a method and a tool for solving the reliability-based design optimization (RBDO). The RBDO aims to minimize a cost function by changing the value of design parameters while ensuring a level of reliability. Uncertainties propagation is a key concept in reliable studies and it can be associated with a sensitivity analysis in order to sort parameter influences. Global and local sensitivities are compared in this study in order to keep a reasonable cost versus accuracy ratio. A software tool has been also developed to automate reliable studies. It is applied to the reliable optimization of a magnetic nano switch with SQP algorithm using Jacobian calculated by composition of automatic and symbolic differentiation.

Keywords: Sensitivity analysis, automatic differentiation, Jacobian, reliability-based design optimization, magnetic nano switch

DOI: 10.3233/JAE-131714

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 43, no. 1-2, pp. 103-113, 2013