Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Selected Papers from the 15th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2011)
Article type: Research Article
Authors: Uchimoto, Tetsuyaa; * | Takagi, Toshiyukia | Ohtaki, Keitarob | Takeda, Yoichib | Kawakami, Akirac
Affiliations: [a] Institute of Fluid Science, Tohoku University, Sendai, Japan | [b] School of Engineering, Tohoku University, Sendai, Japan | [c] Thermal & Nuclear Power Division, Tohoku Electric Power Co., Inc. Sendai, Japan
Correspondence: [*] Corresponding author: Tetsuya Uchimoto, Institute of Fluid Science, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan. Tel./Fax: +81 22 217 5262; E-mail: uchimoto@ifs.tohoku.ac.jp
Abstract: This study discusses the electromagnetic modeling of fatigue cracks in plant environment to improve accuracy of depth sizing with eddy current testing. For the purpose, the factors that influence eddy current signals of fatigue cracks are evaluated. Here, martensitic layer and oxide fillings in fatigue cracks are focused on as influencing factors, and oxides are systematically filled in fatigue cracks by thermal treatment. The measured EC signals change depending on the presence and type of filling oxides. Numerical simulations are conducted to discuss the electromagnetic modeling of cracks with oxide fillings. The types of oxides in the cracks are identified by Raman spectroscopy, and the martensitic layers in vicinity of crack faces are observed by magnetic force microscopy. These results support for the electromagnetic model of environmental fatigue cracks developed in this study.
Keywords: Eddy current testing, environmental fatigue, depth sizing, oxidation, martensitic phase
DOI: 10.3233/JAE-2012-1469
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 39, no. 1-4, pp. 261-268, 2012
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl