Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Selected Papers from the 14th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2009), Part I
Article type: Research Article
Authors: Zeng, Zhiweia; * | Udpa, Lalitab | Udpa, Satish S.b
Affiliations: [a] Department of Aeronautics, Xiamen University, Xiamen, Fujian 361005, China | [b] Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA
Correspondence: [*] Corresponding author. Tel.: +86 158 5929 3851; Fax: +86 592 218 9426; E-mail: zeng@xmu.edu.cn
Abstract: Three-dimensional simulation of eddy current testing (ECT) using finite element method (FEM) has been studied over the past three decades and various methods have been developed. In these methods, the ferrite-core probe is meshed together with the sample. Hence, simulation of probe scanning requires re-meshing, which is not only cumbersome but also a major source of computational noise. In this paper, we propose a novel FEM for the simulation of ECT with ferrite-core probe in which the meshes of ferrite core and sample are generated separately and the coil is not meshed. The new method avoids re-meshing for different probe positions and is simple, flexible, accurate, and efficient.
Keywords: Eddy current testing, finite element method, ferrite-core probe, reduced magnetic vector potential
DOI: 10.3233/JAE-2010-1148
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 33, no. 1-2, pp. 481-486, 2010
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl