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Issue title: Selected Papers from the 13th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2007)
Article type: Research Article
Authors: Cundeva-Blajer, Marijaa | Arsov, Ljupcoa
Affiliations: [a] Ss. Cyril & Methodius University, Faculty of Electrical Engineering and Information Technologies, Karpos II, b.b. POBox 574, 1000 Skopje, R. Macedonia. Tel.: +389 2 3099 162; Fax: +389 2 3064262; E-mail: mcundeva@feit.ukim.edu.mk, ljarsov@feit.ukim.edu.mk
Abstract: In the paper an advanced CAD (computer aided design) methodology for measurement uncertainties estimation of a combined current-voltage instrument transformer (CCVIT) will be presented. The metrological parameters of the CCVIT are influenced by many variables, mostly introduced by the non-linearity of the very complex CCVIT electromagnetic system. The electromagnetic field distribution in the CCVIT 3D domain will be determined by using an original program package FEM-3D (finite element method) developed at the Faculty of Electrical Engineering and Information Technologies (FEIT)-Skopje. The FEM results will be used for further metrological optimal design of the CCVIT by using the genetic algorithm. The FEM-3D estimated CCVIT metrological uncertainties will be experimentally verified through actual test results recorded in a laboratory.
Keywords: Instrument transformer, finite element method, genetic algorithm
DOI: 10.3233/JAE-2008-952
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 28, no. 1-2, pp. 25-31, 2008
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