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Article type: Research Article
Authors: Arunachalam, Kavithaa; * | Udpa, Satish S.b | Udpa, Lalitaa
Affiliations: [a] Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA | [b] College of Engineering, Michigan State University, East Lansing, MI 48824, USA
Correspondence: [*] Corresponding author: Kavitha Arunachalam, 2120 Engineering Building, Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA. Tel.: +1 517 432 1794; Fax: +1 517 353 1980; E-mail: kavithaa@msu.edu
Abstract: Several microwave tomography techniques have been developed to reconstruct the spatial distribution of the electrical property of penetrable objects. These techniques rely on solving the ill-posed nonlinear inverse scattering problem using field measurements acquired from multiple views at multiple frequencies and incorporate prior information during inversion to obtain a stable solution. Such techniques often employ a linear or circular antenna array with individual elements operating as a transceiver to acquire multiple field measurements for imaging. In this paper a tomographic inversion technique with single fixed transmitter and a deformable mirror is proposed as an alternative to the conventional tomography system. Limitations arising from the use of a single transmitter for acquiring multi-view data for the ill-posed problem are overcome by using a continuously deformable mirror with reflective coating. The continuously deformable mirror controlled by an underlying actuator circuit steers the incident field towards the scatterer for multi-view field measurements. A theoretical analysis of the proposed microwave tomography technique including system design, theory, operating principles and selection of optimal mirror shapes to obtain information rich field measurements are discussed in this paper. Computational feasibility of the proposed inverse scattering technique is investigated for two-dimensional penetrable dielectric scatterer in the presence of measurement noise.
Keywords: Deformable mirror, inverse scattering, tomography, microwaves
DOI: 10.3233/JAE-2007-904
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 26, no. 1-2, pp. 147-161, 2007
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