Interfaces removal for time-of-flight eddy current testing: The planar geometry case

Issue title: Proceedings of the twelfth International Symposium on Interdisciplinary Electromagnetic, Mechanic and Biomedical Problems, ISEM Bad Gastein

Article type: Research Article

Authors: Tamburrino, Antonello^{a; b; *} | Tian, Yong^b | Nair, Naveen^b | Udpa, Satish^b

Affiliations: [a] Associazione EURATOM/ENEA/CREATE, DAEIMI, Universita' di Cassino, Via G. Di Biasio, 43 – Cassino 03043, Italy | [b] Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA

Correspondence: [*] Corresponding author. E-mail: tamburrino@unicas.it

Abstract: The time-of-flight (TOF), typically associated with wave propagation processes, can be extracted from physical processes governed by parabolic PDE's, such as those occurring in eddy current testing of conductive materials. The main "tool" for extracting the TOF is the Q-Transform, which is an integral transform capable of relating solutions of hyperbolic PDE's to solutions of parabolic PDE's. The extraction of TOF is considerably more complex when the specimen to be tested has material interfaces, as in any realistic situation. Here we develop a technique capable of "removing" the effects due to known material interfaces.

Keywords: Time-of-flight, Q-transform, eddy current testing, interface removal

DOI: 10.3233/JAE-2007-854

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 25, no. 1-4, pp. 307-312, 2007