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Issue title: Special Volume: Proceedings of the eleventh International Symposium on Applied Electromagnetics and Mechanics ISEM-Versailles ISEM 03
Article type: Research Article
Authors: Xuan, L.a; * | Shanker, B.b | Zeng, Z.b | Udpa, L.b
Affiliations: [a] Department ECE, University of Kentucky, Lexington, KY 40506, USA. Tel.: +1 859 257 8042; Fax: +1 859 257 3092; E-mail: lxuan0@engr.uky.edu | [b] Department ECE, Michigan State University, East Lansing, MI 48824, USA. Tel.:+1 517 355 5066; Fax: +1 517 353 1980; E-mail: {bshanker, zengzhiw, udpal}@egr.msu.edu
Correspondence: [*] Corresponding author
Abstract: Compared with the conventional finite element method that relies on an underlying mesh and element-node connectivity to describe the geometry, meshless method shows its advantage in mesh simplification, tight crack representation and re-meshing process. An effective numerical implementation of the meshless method uses the Galerkin technique and is referred to as the element-free Galerkin (EFG) method. In this paper, the EFG method is applied to a field of electromagnetic computation, namely, simulation of pulsed eddy current testing. The model is validated against analytical solutions.
Keywords: Element-free Galerkin method, pulsed eddy current, finite element method, nondestructive testing
DOI: 10.3233/JAE-2004-609
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 19, no. 1-4, pp. 463-466, 2004
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