Flaw detection using dc magnetic field measurement

Issue title: Proceedings of the tenth International Symposium on Applied Electromagnetics and Mechanics ISEM-Tokyo

Article type: Research Article

Authors: Sebestyén, I.^{a; *} | Pávó, J.^a

Affiliations: [a] Department of Electromagnetic Theory, Budapest University of Technology and Economics, H-1521 Hungary

Correspondence: [*] Corresponding author: Egry József u. 18, H-1521 Budapest, Hungary. Tel.: +36 1 463 2812; Fax: +36 1 463 3189; E-mail: si@evtsz1.evt.bme.hu

Abstract: Detection of internal flaws in conducting materials with considerable thickness is difficult using eddy current tests. This paper presents an alternative method, which uses dc magnetic field excited by the current impressed across the conducting material. In this case the internal flaws give rise perturbations of current flow and consequently the magnetic field is also changed. Perturbations in the magnetic field can be detected by dc (direct current) sensors such as magnetoresistive or Fluxset sensors. In this work numerically performed experiments are presented to recover flaws at the interfaces of metal parts jointed at high temperature by high intensity pressure.

DOI: 10.3233/JAE-2002-430

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 15, no. 1-4, pp. 53-60, 2002