An extension of modular decoupling methodology for EMC to enclosure with aperture and some contents

Article type: Research Article

Authors: Edrisi, M.^a | Chan, W.K.^a | Nafalski, A.^a

Affiliations: [a] School of Electrical and Information Engineering, University of South Australia, Australia

Abstract: This paper addresses the modular decoupling methodology (MDM) [1]. It predicts EMC by the simulation of the effects of radiated emissions on an enclosure with a prescribed aperture and some contents. The proposed method could be a tool for preventing some possible EMI problems at the design stage. Computer simulations are developed using the finite element method and the investigation assesses the effectiveness of the shielding and susceptibility predictions. Exploration on an external emission source and its impact to lower stage is also considered.

DOI: 10.3233/JAE-2000-207

Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 12, no. 3-4, pp. 211-217, 2000