Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Nguyen, T.H.a; c; * | Nguyen, T.L.b | Afanasiev, A.D.b | Pham, T.L.c
Affiliations: [a] Baikal School of BRICS, Irkutsk National Research Technical University, Irkutsk, Russia | [b] Laboratory of Artificial Intelligence and Machine Learning, Institute of Information Technology and Data Science, Irkutsk National Research Technical University, Irkutsk, Russia | [c] University of Information and Communication Technology, Thai Nguyen University, Thai Nguyen, Vietnam
Correspondence: [*] Corresponding author: T.H. Nguyen, Baikal School of BRICS, Irkutsk National Research Technical University, Irkutsk, Russia. E-mail: thuhuongyb@gmail.com.
Abstract: Pavement defect detection and classification systems based on machine learning algorithms are already very advanced and are increasingly demonstrating their outstanding advantages. One of the most important steps in the processing is image segmentation. In this paper, some image segmentation algorithms used in practice are presented, compared and evaluated. The advantages and disadvantages of each algorithm are evaluated and compared based on the criteria PA, MPA, F1. We propose a method to optimize the process of image segmentation of pavement defects using a combination of Markov Random Fields and graph theory. Experiments were conducted on 3 datasets from Portugal, Russia and Vietnam. Empirical results show that the segmentation of pavement defects is more accurate and effective when the two methods are combined.
Keywords: Computer vision, machine learning, pavement defects, image segmentation, graph theory, markov random field
DOI: 10.3233/IDT-210020
Journal: Intelligent Decision Technologies, vol. 15, no. 4, pp. 591-597, 2021
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl