Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: 18th Iberoamerican Congress on Pattern Recognition (CIARP) November 20–23, 2013, Havana, Cuba
Guest editors: José Ruiz-Shulcloper and Gabriella Sanniti di Baja
Article type: Research Article
Authors: Rosales-Méndez, Henrya | Ramírez-Cruz, Yuniorb; *
Affiliations: [a] Computer Science Departament, Universidad de Oriente, Santiago de Cuba, Cuba | [b] Departament d'Enginyeria Informàtica i Matemàtiques, Universitat Rovira i Virgili, Tarragona, Spain
Correspondence: [*] Corresponding author: Yunior Ramírez-Cruz, Departament d'Enginyeria Informàtica i Matemàtiques, Universitat Rovira i Virgili, Av. Països Catalans 26, Tarragona 43007, Spain. E-mail: yunior.ramirez@urv.cat.
Abstract: The validation of overlapping clusterings has gained considerable attention in the last years, as it represents a fundamental step towards achieving reliable clustering algorithms, still being largely considered as an open question. A number of measures have been proposed for validating overlapping clusterings, but it remains unclear which one is the most convenient. Most existing external measures aim to validate partitional clusterings, even when most real-life problem involve overlapping clustering scenarios. In this paper, we propose a new external measure specifically designed for validating overlapping clusterings, which fulfills the main set of desirable conditions presented in the literature. We also show that our proposal correctly handles situations where previous measures display undesirable performances.
Keywords: Overlapping clustering algorithms, cluster validation, external measure
DOI: 10.3233/IDA-140707
Journal: Intelligent Data Analysis, vol. 18, no. 6S, pp. S33-S45, 2014
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl