Simulation of the charge migration in DNA under irradiation with heavy ions

Issue title: Frontiers in Biomedical Engineering and Biotechnology – Proceedings of the 4th International Conference on Biomedical Engineering and Biotechnology, 18–21 August 2015, Shanghai, China

Guest editors: Feng Liu, Dong-Hoon Lee, Ricardo Lagoa and Sandeep Kumar

Article type: Research Article

Authors: Belov, Oleg V.^a | Boyda, Denis L.^b | Plante, Ianik^c | Shirmovsky, Sergey Eh.^{b; *}

Affiliations: [a] Laboratory of Radiation Biology, Joint Institute for Nuclear Research, 6 Joliot-Curie Street, 141980 Dubna, Moscow Region, Russia | [b] Far Eastern Federal University, 8 Sukhanov Street, 690950 Vladivostok, Russia | [c] Wyle Science, Technology and Engineering, 1300 Hercules Ave, Houston, Texas 77058, USA

Correspondence: [*] Address for correspondence: Sergey Eh. Shirmovsky, Far Eastern Federal University, 8 Sukhanov Street, 690950, Vladivostok, Russia. Tel.: +7 914 7906601; Fax: +7 423 2432315; E-mail: shirmovskiy.sye@dvfu.ru.

Keywords: DNA damage, charge migration, radiation

DOI: 10.3233/BME-151496

Journal: Bio-Medical Materials and Engineering, vol. 26, no. s1, pp. S1937-S1944, 2015