Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Ahmad, Jana; * | Křemen, Petr
Affiliations: Department of Computer Science, Faculty of Electrical Engineering, Czech Technical University in Prague, Czech Republic
Correspondence: [*] Corresponding author. E-mail: ahmadjan@fel.cvut.cz.
Note: [] Accepted by: Gilles Kassel
Abstract: Recently, there has been growing interest in the use of ontology as a fundamental tool for representing domain-specific conceptual models to improve the semantics, accuracy, and relevance of domain users’ query results. Although the amount of data has grown steadily over the past decade, much data shares similar characteristics that can be captured by a foundational ontology. In this paper, we show how queries based on a foundational ontology can be evaluated and their performance measured. We also present a Foundational Patterns benchmark to help select the most efficient triple memory and its layout. We evaluate the foundational benchmark with both generated and real datasets for state-of-the-art triple stores.
Keywords: Foundational Pattern, UFO, SPARQL
DOI: 10.3233/AO-220274
Journal: Applied Ontology, vol. 17, no. 4, pp. 465-494, 2022
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl