Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Issue title: Proceedings from the 17th International Symposium on Applied Electromagnetics and Mechanics (ISEM 2015)
Guest editors: Fumio Kojima, Futoshi Kobayashi and Hiroyuki Nakamoto
Article type: Research Article
Authors: Fu, Xina | Xie, Shilina; * | Li, Jianb | Zhu, Changchunb | Zhang, Xinongb
Affiliations: [a] State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi'an Jiaotong University, Xi'an, Shaanxi, China | [b] Institute of Systems Engineering, China Academy of Engineering Physics, Mianyang, Sichuan, China
Correspondence: [*] Corresponding author: Shilin Xie, State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China. E-mail:slxie@mail.xjtu.edu.cn
Abstract: The strain (or stress) responses of structures are generally of primary concern because they can provide an important reference to the assessment of structure failure modes as well recognized. The response surface method (RSM) is employed in strain response-based finite element model updating in the paper. The model updating procedures are outlined and the approach is then applied to a simply supported beam model. In addition, the traditional updating method (sensitivity-based method) is compared with the RSM method. The results show that response surface models can accurately reflect the relationships between design parameters and characteristic quantities and thus possesses better strain response correction performance than the traditional method. Besides that, the RSM based model updating by modifying boundary conditions is conducted, which is difficult to achieve with the sensitivity-based method. The model updating based on measured data validates the effectiveness and accuracy of the present method.
Keywords: Strain response, response surface method, model updating, optimization
DOI: 10.3233/JAE-162149
Journal: International Journal of Applied Electromagnetics and Mechanics, vol. 52, no. 3-4, pp. 1087-1097, 2016
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
sales@iospress.com
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
info@iospress.nl
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office info@iospress.nl
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
china@iospress.cn
For editorial issues, like the status of your submitted paper or proposals, write to editorial@iospress.nl
如果您在出版方面需要帮助或有任何建, 件至: editorial@iospress.nl